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SERIAL EEPROM 24C02A

transistor BC558

SEVAN SEGMENT

transistor BC 548

transistor 2N2222

IC 74LS47

ULN2003

UM66 IC

IC L293D

IC 7906

APLICATIONS

DEFECTS IN FORGED PARTS

DEFECTS IN FORGED PARTS

DEFECTS IN FORGED PARTS Defects commonly found in forged parts that have been subjected to plastic deformation areĀ as follows. (i) Defects resulting from the melting practice...

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